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硅和碳化硅MOSFET中PN结SEM图像掺杂衬度分析
冯文洁, 蔡亚辉, 付祥和, 黄丹阳, 王丹, 贺永宁
J Univ Electr Sci Technol Chin . 2025, (
03
): 347 -352 .