基于子阵列自适应成像的RCS测量方法

基于子阵列自适应成像的RCS测量方法

Journal of Guilin University of Electronic Technology ›› 2020, Vol. 40 ›› Issue (04) : 270-273. DOI: 10.16725/j.cnki.cn45-1351/tn.2020.04.002

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TN957.52

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